variable pressure scanning electron microscope Search Results


6480 variable-pressure scanning electron microscope  (JEOL)
90
JEOL 6480 variable-pressure scanning electron microscope
6480 Variable Pressure Scanning Electron Microscope, supplied by JEOL, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/6480 variable-pressure scanning electron microscope/product/JEOL
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6480 variable-pressure scanning electron microscope - by Bioz Stars, 2026-03
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s-3000n variable pressure scanning electron microscope  (Hitachi Ltd)
90
Hitachi Ltd s-3000n variable pressure scanning electron microscope
S 3000n Variable Pressure Scanning Electron Microscope, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/s-3000n variable pressure scanning electron microscope/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
s-3000n variable pressure scanning electron microscope - by Bioz Stars, 2026-03
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variable-pressure scanning electron microscope s-3400n  (Hitachi Ltd)
90
Hitachi Ltd variable-pressure scanning electron microscope s-3400n
Variable Pressure Scanning Electron Microscope S 3400n, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable-pressure scanning electron microscope s-3400n/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
variable-pressure scanning electron microscope s-3400n - by Bioz Stars, 2026-03
90/100 stars
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variable pressure scanning electron microscope (vp-sem  (Hitachi Ltd)
90
Hitachi Ltd variable pressure scanning electron microscope (vp-sem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope (Vp Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure scanning electron microscope (vp-sem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
variable pressure scanning electron microscope (vp-sem - by Bioz Stars, 2026-03
90/100 stars
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variable pressure scanning electron microscope  (Carl Zeiss)
90
Carl Zeiss variable pressure scanning electron microscope
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure scanning electron microscope/product/Carl Zeiss
Average 90 stars, based on 1 article reviews
variable pressure scanning electron microscope - by Bioz Stars, 2026-03
90/100 stars
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sigmatm variable pressure scanning electron microscope (sem)  (Carl Zeiss)
90
Carl Zeiss sigmatm variable pressure scanning electron microscope (sem)
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Sigmatm Variable Pressure Scanning Electron Microscope (Sem), supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/sigmatm variable pressure scanning electron microscope (sem)/product/Carl Zeiss
Average 90 stars, based on 1 article reviews
sigmatm variable pressure scanning electron microscope (sem) - by Bioz Stars, 2026-03
90/100 stars
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scanning electron microscope conventional/variable pressure sem  (SII NanoTechnology USA Inc)
90
SII NanoTechnology USA Inc scanning electron microscope conventional/variable pressure sem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Scanning Electron Microscope Conventional/Variable Pressure Sem, supplied by SII NanoTechnology USA Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/scanning electron microscope conventional/variable pressure sem/product/SII NanoTechnology USA Inc
Average 90 stars, based on 1 article reviews
scanning electron microscope conventional/variable pressure sem - by Bioz Stars, 2026-03
90/100 stars
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variable-pressure scanning electron microscope vp-sem 1455  (JEOL)
90
JEOL variable-pressure scanning electron microscope vp-sem 1455
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope Vp Sem 1455, supplied by JEOL, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable-pressure scanning electron microscope vp-sem 1455/product/JEOL
Average 90 stars, based on 1 article reviews
variable-pressure scanning electron microscope vp-sem 1455 - by Bioz Stars, 2026-03
90/100 stars
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su6600 variable pressure field emission scanning electron microscope  (Hitachi Ltd)
90
Hitachi Ltd su6600 variable pressure field emission scanning electron microscope
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Su6600 Variable Pressure Field Emission Scanning Electron Microscope, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/su6600 variable pressure field emission scanning electron microscope/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
su6600 variable pressure field emission scanning electron microscope - by Bioz Stars, 2026-03
90/100 stars
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s3500n scanning electron microscope  (Hitachi Ltd)
90
Hitachi Ltd s3500n scanning electron microscope
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
S3500n Scanning Electron Microscope, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/s3500n scanning electron microscope/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
s3500n scanning electron microscope - by Bioz Stars, 2026-03
90/100 stars
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mira xmu variable pressure field emission scanning electron microscope—feg sem  (TESCAN USA Inc)
90
TESCAN USA Inc mira xmu variable pressure field emission scanning electron microscope—feg sem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Mira Xmu Variable Pressure Field Emission Scanning Electron Microscope—Feg Sem, supplied by TESCAN USA Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/mira xmu variable pressure field emission scanning electron microscope—feg sem/product/TESCAN USA Inc
Average 90 stars, based on 1 article reviews
mira xmu variable pressure field emission scanning electron microscope—feg sem - by Bioz Stars, 2026-03
90/100 stars
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variable pressure field emission scanning electron microscope (vp-fe-sem  (Hitachi Ltd)
90
Hitachi Ltd variable pressure field emission scanning electron microscope (vp-fe-sem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Field Emission Scanning Electron Microscope (Vp Fe Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure field emission scanning electron microscope (vp-fe-sem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
variable pressure field emission scanning electron microscope (vp-fe-sem - by Bioz Stars, 2026-03
90/100 stars
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Image Search Results


Scanning electron microscopy (SEM) and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).

Journal: Plants

Article Title: Antioxidant Responses of Phenolic Compounds and Immobilization of Copper in Imperata cylindrica , a Plant with Potential Use for Bioremediation of Cu Contaminated Environments

doi: 10.3390/plants9101397

Figure Lengend Snippet: Scanning electron microscopy (SEM) and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).

Article Snippet: In order to localize the Cu-bound to the shoot and root tissues, plants with 21 days of growth were observed by Variable Pressure Scanning Electron Microscope (VP-SEM), with transmission module STEM SU-3500 (Hitachi, Tokyo, Japan).

Techniques: Electron Microscopy